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Computer simulations of crater profiles in glow discharge optical emission spectrometry: comparison with experiments and investigation of the underlying mechanisms”. Bogaerts A, Verscharen W, Steers E, Spectrochimica acta: part B : atomic spectroscopy 59, 1403 (2004). http://doi.org/10.1016/j.sab.2004.06.005
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Glow discharge optical emission spectrometry: moving towards reliable thin film analysis: a short review”. Angeli J, Bengtson A, Bogaerts A, Hoffmann V, Hodoroaba V-D, Steers E, Journal of analytical atomic spectrometry 18, 670 (2003). http://doi.org/10.1039/b301293j
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