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Author |
Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
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Title |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
Type |
H3 Book chapter |
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Year  |
2007 |
Publication |
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Abbreviated Journal |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Additional Links |
UA library record |
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Impact Factor |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:64598 |
Serial |
5572 |
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Author |
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. |
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Title |
Component selection for a compact micro-XRF spectrometer |
Type |
A1 Journal article |
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Year |
2001 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
30 |
Issue |
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Pages |
8-14 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Corporate Author |
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Wos |
000166923700003 |
Publication Date |
2002-08-25 |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
33 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.298; 2001 IF: 1.414 |
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Call Number |
UA @ admin @ c:irua:36126 |
Serial |
5534 |
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