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Author |
Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; Hevesi, K.; Gensterblum, G.; Yu, L.M.; Pireaux, J.J.; Grey, F.; Bohr, J. |
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Title |
Structural defects and epitaxial rotation of C60 and C70 (111) films on GeS(001) |
Type |
A1 Journal article |
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Year  |
1996 |
Publication |
Journal of applied physics |
Abbreviated Journal |
J Appl Phys |
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Volume |
80 |
Issue |
6 |
Pages |
3310-3318 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
A transmission electron microscopy study of epitaxial C-60 and C-70 films grown on a GeS (001) surface is presented. The relationship between the orientation of the substrate and the films and structural defects in the films, such as grain boundaries, unknown in bulk C-60 and C-70 crystals, are studied. Small misalignments of the overlayers with respect to the orientation of the substrate, so-called epitaxial rotations, exist mainly in C-70 films, but also sporadically in the C-60 overlayers. A simple symmetry model, previously used to predict the rotation of hexagonal overlayers on hexagonal substrates, is numerically tested and applied to the present situation. Some qualitative conclusions concerning the substrate-film interaction are deduced. (C) 1996 American Institute of Physics. |
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Publisher |
American Institute of Physics |
Place of Publication |
New York, N.Y. |
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Wos |
A1996VG68100027 |
Publication Date |
2002-07-26 |
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Edition |
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ISSN |
0021-8979; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.183 |
Times cited |
6 |
Open Access |
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Notes |
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Call Number |
UA @ lucian @ c:irua:95233 |
Serial |
3229 |
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Author |
Bohr, J.; Gibbs, D.; Sinha, S.K.; Krätschmer, W.; Van Tendeloo, G.; Larsen, E.; Egsgaard, H.; Berman, L.E. |
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Title |
Order, disorder and structure of crystals C60/C70 |
Type |
A1 Journal article |
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Year |
1992 |
Publication |
Europhysics letters |
Abbreviated Journal |
Epl-Europhys Lett |
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Volume |
17 |
Issue |
4 |
Pages |
327-332 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Single crystals with two different morphologies, black and brown, of C60 with about 12% C70 have been studied by synchrotron X-ray diffraction. Integrated intensities from 8 reflections show that the charge distribution of the C60 cluster is shell-like giving rise to an oscillatory behaviour in the diffracted intensities. From the intensities, the distance between diametrically opposite carbon atoms has been determined to be (7.24 +/- 0.22) angstrom. The thickness of the charge distribution of the shell can be estimated as 3.06 angstrom and the cavity within a C60 cluster to have a diameter of about 4.18 angstrom. The finite longitudinal width of the diffraction peaks from black crystals indicates a lack of long-range crystalline order. The rocking curves are about 7-degrees broad and depict an unusually smooth behaviour. This may be indicative of a glassy or hexatic phase. High-resolution electron microscopy allows small crystallites with a relatively well-defined orientation relationship to be identified. In contrast, brown crystals have long-range order. |
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Place of Publication |
Paris |
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Wos |
A1992GV54200008 |
Publication Date |
2007-07-26 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0295-5075;1286-4854; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.095 |
Times cited |
15 |
Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:4434 |
Serial |
2501 |
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