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Author
Title
Year
Publication
Volume
Times cited
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De Backer, A.
;
van den Bos, K.H.W.
;
Van den Broek, W.
;
Sijbers, J.
;
Van Aert, S.
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
2016
Ultramicroscopy
171
43
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