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Author
Title
Year
Publication
Volume
Times cited
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Van Aert, S.
;
den Dekker, A.J.
;
van den Bos, A.
;
van Dyck, D.
High-resolution electron microscopy : from imaging toward measuring
2002
IEEE transactions on instrumentation and measurement
51
13
UA library record
;
WoS full record
;
WoS citing articles
