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Author Janssens, K.; Alfeld, M.; van der Snickt, G.; de Nolf, W.; Vanmeert, F.; Radepont, M.; Monico, L.; et al.
Title The use of synchrotron radiation for the characterization of artists' pigments and paintings Type A1 Journal article
Year (down) 2013 Publication Annual review of analytical chemistry Abbreviated Journal Annu Rev Anal Chem
Volume 6 Issue Pages 399-425
Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Abstract We review methods and recent studies in which macroscopic to (sub)microscopic X-ray beams were used for nondestructive analysis and characterization of pigments, paint microsamples, and/or entire paintings. We discuss the use of portable laboratory- and synchrotron-based instrumentation and describe several variants of X-ray fluorescence (XRF) analysis used for elemental analysis and imaging and combined with X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Macroscopic and microscopic (μ-)XRF variants of this method are suitable for visualizing the elemental distribution of key elements in paint multilayers. Technical innovations such as multielement, large-area XRF detectors have enabled such developments. The use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that take place during natural pigment alteration processes. However, synchrotron-based combinations of μ-XRF, μ-XAS, and μ-XRD are suitable for such studies.
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Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000323887500019 Publication Date 2013-06-18
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1936-1327 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 7.435 Times cited 46 Open Access
Notes ; ; Approved Most recent IF: 7.435; 2013 IF: 7.814
Call Number UA @ admin @ c:irua:111315 Serial 5902
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