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Wet etching of TiN in 1-D and 2-D confined nano-spaces of FinFET transistors”. Vereecke G, De Coster H, Van Alphen S, Carolan P, Bender H, Willems K, Ragnarsson L-A, Van Dorpe P, Horiguchi N, Holsteyns F, Microelectronic engineering 200, 56 (2018). http://doi.org/10.1016/J.MEE.2018.09.004
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Why does not the leaf weight-area allometry of bamboos follow the 3/2-power law?”.Lin S, Shao L, Hui C, Song Y, Reddy GVP, Gielis J, Li F, Ding Y, Wei Q, Shi P, Reddy GVP, Frontiers in plant science 9, 583 (2018). http://doi.org/10.3389/FPLS.2018.00583
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