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Author Title Year (up) Publication Volume Times cited Additional Links
Gauquelin, N.; Zhang, H.; Zhu, G.; Wei, J.Y.T.; Botton, G.A. Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7-\delta thin films 2018 AIP advances 8 1 UA library record; WoS full record; WoS citing articles