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Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten”. Adriaensen L, Vangaever F, Gijbels R, Chemie magazine , 10 (2004)
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Orientation fluctuations, diffuse scattering and orientational order in solid C60”. Michel KH, Copley JRD World Scientific, Singapore, page 381 (1996).
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Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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Oxide superconductors: electron microscopy”. Mitchell TE, Gronsky R, Van Tendeloo G Pergamon Press, Oxford, page 401 (1992).
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Oxygen ordering and critical temperature plateaus in ABa2Cu3O7-d (A=Er, Nd, Sm, Yb), pp”. Zou H, Krekels T, Van Tendeloo G, Wagener G, Buchgeister M, Hosseini SM, Kopitzki K, , 278 (1992)
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Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 49 (2004)
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Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 12th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS), Tokyo, 835 (1997)
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The phase diagram”. Peeters FM Kluwer Academic Publishers, Dordrecht, page 17 (1997).
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Phase transitions in AC60 (A=Rb, Cs) fullerides”. Nikolaev AV, Prassides K, Michel KH, Recent advances in the chemistry and physics of fullerenes and related materials 5, 450 (1997)
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Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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Physics of generation and detection of signals used for microcharacterization”. Remond G, Gijbels R, Levenson LL, Shimizu R Scanning Microscopy International, Chicago, Ill. (1994).
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Plasma chemistry modeling for an inductively coupled plasma used for the growth of carbon nanotubes”. Mao M, Bogaerts A, Journal of physics : conference series 275, 012021 (2011). http://doi.org/10.1088/1742-6596/275/1/012021
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Van Gaens W (2014) Plasma chemistry modelling of an atmospheric pressure argon plasma jet with air impurities for plasma medicine applications. Antwerpen
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Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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Polarity-dependent vortex pinning and spontaneous vortex-antivortex structures in superconductor/ferromagnet hybrids”. Bending SJ, Milošević MV, Moshchalkov VV Springer, Berlin, page 299 (2010).
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Polaron effects on cyclotron mass due to interface and slab phonons in GaAs/AlGaAs quantum wells”. Hai G-Q, Studart N, Peeters FM, Brazilian journal of physics 26, 219 (1996)
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Tavernier S, op de Beeck W, Ghekiere J-P, Van Tendeloo G (1996) Positively charged toner for use in electrostatography : US5532097 : 07/02/1996
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Precipitation behavior in Cu-Co alloy”. Takeda M, Shinohara G, Yamada H, Yoshida S, van Landuyt J, Hashimoto H, , 205 (1998)
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Precision magnetometry on a submicron scale”. Geim AK, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, , 3311 (1996)
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Preconcentration of precious metals by tellurium sulphide fire-assay followed by instrumental neutron activation analysis”. Shazali I, Van 't dack L, Gijbels R, , 29 (1988)
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Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
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Probing of the electron-phonon interaction using high magnetic fields”. Peeters FM, Physicalia magazine 19, 187 (1997)
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Cao S (2010) Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view. Antwerpen
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Wang W-C (2011) Quantitative analysis of electron exit waves with single atom sensitivity. Antwerpen
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Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1”. de Vyt A, Gijbels R, van Roost C, Geuens I, , 524 (1998)
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de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
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Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
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Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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