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High-resolution desktop microcomputed tomography for the evaluation of reducing treatments on historical glass suffering from manganese browning”. Nuyts G, Cagno S, Jaroszewicz J, Wouters H, De Vis K, Caen J, Janssens K page 201 (2013).
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High-resolution X-ray fluorescence micro-tomography on single sediment particles”. Vincze L, Vekemans B, Szalóki I, Janssens K, Van Grieken R, Feng H, Jones KW, Adams F page 240 (2002).
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ID18F: a new X-ray microprobe end station”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, ESRF highlights 2001 , 96 (2002)
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Identification of the geochemical forms of CR, Zn, Ni, Pb, V, and Cu in an industrial polluted soil by combined μ-XRF/μ-XRD and μ-XANES”. Terzano R, Spagnuolo M, Ruggiero P, Vekemans B, de Nolf W, Janssens K, Fiore S, Falkenberg G (2008).
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In-vivo 3D mapping and local speciation of Se compounds in roots and leaves of Allium Cepa”. Janssens K, Proost K, Wysocka A, Bulska E, Wierzbicka M (2005).
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Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments”. Proost K, Schalm O, Janssens K, Van Dyck D (2005).
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A laboratory mu-XRF spectrometer employing capillary optics”. Janssens K, Vekemans B, Rindby A, Vincze L, Adams F, , 159 (1995)
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Macro X-ray fluorescence (MA-XRF) scanning : a new and efficient method for documenting stained-glass panels”. Caen J, Legrand S, van der Snickt G, Janssens K, (2015)
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Methods 4: elemental analysis (AAS/AES/X-ray fluorescence)”. Janssens K (2003).
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Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
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Microscopic synchroton radiation induced X-ray fluorescence analysis”. Janssens K, Vincze L, Aerts A, Vekemans B, Adams F, Jones K, Knöchel A, Mikrochimica acta: supplementum , 87 (1996)
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Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
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Microscopic X-ray fluorescence analysis at second and third generation synchrotron sources”. Janssens K, Adams F, Debye Institute synchrotron chronicle , 9 (1997)
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Monte Carlo simulation for X-ray fluorescence spectroscopy”. Vincze L, Janssens K, Vekemans B, Adams F page 435 (2004).
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Monte Carlo simulation of X-ray fluorescence and scattering tomography experiments”. Vincze L, Janssens K, Vekemans B, Adams F page 328 (1999).
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Monte Carlo simulation of X-ray fluorescence spectra: part 4: photon scattering at high X-ray energies”. Vincze L, Janssens K, Vekemans B, Adams F, Spectrochimica acta: part B : atomic spectroscopy , 1711 (1999). http://doi.org/10.1016/S0584-8547(99)00094-4
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Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Van Grieken R, Janssens K, van Espen P, Injuk J, Padilla R, Vittiglio G, Potgieter JH page 45 (2005).
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Injuk J, Janssens K, van Espen P, Van Grieken R, (2001)
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On the distinction between 16th and 17th century Venetian glass and façon-de-Venise glass”. de Raedt I, Janssens K, Veeckman J page 95 (2002).
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Overview”. Janssens K, Adams F page 1 (2000).
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Parameters influencing focussing capabilities of capillary optics”. Vincze L, Janssens K, Adams F, Larsson S, Rindby A, Engstrom P, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 161 (1995)
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Pigment identification by scanning μ-XRF/μ-XRD”. de Nolf W, Vekemans B, Janssens K, van der Snickt G, Falkenberg G (2007).
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Polycapillary X-ray optics”. Gao N, Janssens K page 89 (2004).
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Preface”. Van Grieken R, Janssens K page vii-viii (2005).
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Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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Provenance analysis of glass artefacts”. Gratuze B, Janssens K page 663 (2004).
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Provenance analysis of Roman glass from the 1st-6th century A.D”. Aerts A, Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Radtke M, Knöchel A, HASYLAB Jahresbericht , 918 (1996)
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Quantification of SY-XRF measurements at the X-ray microprobe”. Haller M, Radtke M, Knöchel A, Clöck W, Sutton S, Janssens K, Vincze L, HASYLAB Jahresbericht , 956 (1996)
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