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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Biermans, E. |
Electron tomography : from qualitative to quantitative |
2012 |
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UA library record |
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Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
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UA library record |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L. |
Electron microscopy study of twinning in the Ni5Al3 bainitic phase |
1994 |
TMS |
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Schryvers, D.; van Landuyt, J.T. |
Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite |
1993 |
Proceedings Of The International Conference On Martensitic Transformations (icomat-92) |
|
1 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Van Landuyt, J. |
Electron microscopy study of twin sequences and branching in NissAl34 3R martensite |
1992 |
ICOMAT |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 2: plate crystallography |
1995 |
Acta metallurgica et materialia |
43 |
11 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Electron microscopy study of the formation of Ni5Al3 in a Ni62.5Al37.5 B2 alloy: 1: precipitation and growth |
1995 |
Acta metallurgica et materialia |
43 |
27 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
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UA library record; WoS full record; |
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Shi, H.; Pourbabak, S.; Van Humbeeck, J.; Schryvers, D. |
Electron microscopy study of Nb-rich nanoprecipitates in NiTiNb and their influence on the martensitic transformation |
2012 |
Scripta materialia |
67 |
29 |
UA library record; WoS full record; WoS citing articles |
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Luyten, W.; Van Tendeloo, G.; Amelinckx, S.; Collins, J.L. |
Electron microscopy study of defects in synthetic diamond layers |
1992 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
66 |
36 |
UA library record; WoS full record; WoS citing articles |
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Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.; Ivanov, V.; Nagy, J.B. |
Electron microscopy study of coiled carbon tubules |
1995 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
71 |
72 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
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Pauwels, B.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. |
Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles |
1999 |
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UA library record |
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Schryvers, D.; Tanner, L.E. |
Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5 |
1992 |
Shape memory materials and phenomena: fundamental aspects and applications |
246 |
5 |
UA library record; WoS full record; WoS citing articles |
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Amelinckx, S.; Van Tendeloo, G. |
Electron microscopy of recent high Tc superconductors |
1994 |
Physica: C : superconductivity |
235/240 |
6 |
UA library record; WoS full record; WoS citing articles |
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Lubk, A.; Béché, A.; Verbeeck, J. |
Electron Microscopy of Probability Currents at Atomic Resolution |
2015 |
Physical review letters |
115 |
12 |
UA library record; WoS full record; WoS citing articles |
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Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
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UA library record |
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Hu, Z.-Y. |
Electron microscopy of hierarchically structured nanomaterials : linking structure to properties and synthesis |
2016 |
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UA library record |
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
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UA library record |
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Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. |
Electron microscopy of fullerenes and fullerene related structures |
1994 |
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UA library record |
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of C60 and C70 fullerites |
1993 |
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UA library record |
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Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
Electron microscopy of carbon nanotubes and related structures |
1997 |
The journal of physics and chemistry of solids |
58 |
12 |
UA library record; WoS full record; WoS citing articles |
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Huvé, M.; Renard, C.; Abraham, F.; Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of a family of hexagonal perovskites: one-dimensional structures related to Sr4Ni3O9 |
1998 |
Journal of solid state chemistry |
135 |
30 |
UA library record; WoS full record; WoS citing articles |
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Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
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Weill, F.; Chevalier, B.; Chambon, M.; Tressaud, A.; Darriet, B.; Etourneau, J.; Van Tendeloo, G. |
Electron microscopy investigation of superconducting La2Cu(O,F)4+y oxyfluoride |
1993 |
European journal of solid state and inorganic chemistry |
30 |
2 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
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Volkov, V.V.; van Heurck, C.; van Landuyt, J.; Amelinckx, S.; Zhukov, E.G.; Polulyak, E.S.; Novotortsev, V.M. |
Electron microscopy and X-ray study of the growth of FeCr2S4 spinel single crystals by chemical vapour transport |
1993 |
Crystal research and technology |
28 |
1 |
UA library record; WoS full record; WoS citing articles |
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Dluzewski, P.; Pietraszko, A.; Kozlowski, M.; Szczepanska, A.; Gorecka, J.; Baran, M.; Leonyuk, L.; Babonas, G.J.; Lebedev, O.I.; Szymczak, R. |
Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals |
2000 |
Acta physica Polonica: A: general physics, solid state physics, applied physics |
98 |
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UA library record; WoS full record; |
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Cziraki, A.; Fogarassy, F.; Van Tendeloo, G.; Lamparter, P.; Tegze, M.; Bakonyi, I. |
Electron microscopy and X-ray diffraction studies of rapidly quenched Zr-Ni an Hf-Ni ribbons with about 90 at.% Ni |
1994 |
Journal of alloys and compounds |
210 |
26 |
UA library record; WoS full record; WoS citing articles |
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Frangis, N.; van Landuyt, J.; Grimaldi, M.G.; Calcagno, L. |
Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He+ |
1996 |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium 1 on New Trends in Ion Beam Processing of Materials, at the, E-MRS 96 Spring Meeting, June 04-07, 1996, Strasbourg, France |
120 |
2 |
UA library record; WoS full record; WoS citing articles |
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