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Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles”. Tsuji K, Takenaka H, Wagatsuma K, de Bokx PK, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1881 (1999). http://doi.org/10.1016/S0584-8547(99)00143-3
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Optimization of sample preparation for grazing emission X-ray fluorescence in micro- and trace analysis applications”. Claes M, de Bokx P, Willard N, Veny P, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 52, 1063 (1997). http://doi.org/10.1016/S0584-8547(96)01654-0
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Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques”. Hołynska B, Olko M, Ostachowicz B, Ostachowicz J, Wegrzynek D, Claes M, Van Grieken R, de Bokx P, Kump P, Necemer M, Fresenius' journal of analytical chemistry 362, 294 (1998). http://doi.org/10.1007/S002160051077
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Progress in laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, X-ray spectrometry 28, 224 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
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Quantification in grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken RE, de Bokx PK, Urbach HP, Spectrochimica acta: part B : atomic spectroscopy 54, 1525 (1999). http://doi.org/10.1016/S0584-8547(99)00051-8
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Recent developments of laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, , 103 (1999)
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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