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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 3, 1 (1994)
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Defect structure of Hg-based ceramic superconductors”. Van Tendeloo G, Hervieu M, Chaillout C, Icem 13, 949 (1994)
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Destruction of magnetophonon resonance in high mobility heterojunctions from competition between elastic and inelastic scattering”. Xu W, Leadley DR, Peeters FM, Devreese JT, Nicholas RJ, Harris JJ, Foxon CT, Proceedings of the International Conference on the Physics of Semiconductors 22, 839 (1994)
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Effects of confinement in strongly-coupled superlattices on impurity bound magneto-polarons”. Shi JM, Peeters FM, Devreese JT, Cheng J-P, Kono J, McCombe BD, Proceedings of the International Conference on the Physics of Semiconductors 22, 2267 (1994)
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Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
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Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
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Electron mobility in Si delta-doped GaAs”. Hai GQ, Studart N, Peeters FM, Devreese JT, Koenraad PM, van de Stadt AFW, Wolter JH, Proceedings of the International Conference on the Physics of Semiconductors 22, 823 (1994)
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Electrons in non-homogeneous magnetic fields”. Peeters FM, Matulis A, Brazilian journal of physics 24, 283 (1994)
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Excited states of the one-dimensional bipolaron in the strong coupling limit”. Vansant P, Smondyrev MA, Peeters FM, Devreese JT, Bulletin of the American Physical Society 39, 889 (1994)
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Formation of diamond nanocrystals in laser-irradiated amorphous carbon films”. Nistor LC, van Landuyt J, Ralchenko VG, Kononenko TV, Obraztsova ED, Strelnitsky VE, International Conference on the New Diamond Science and Technology 4, 25 (1994)
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A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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High resolution electron microscopy of recent high Tc superconductors”. Van Tendeloo G, European Crystallographic Meeting 15, 20 (1994)
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HREM characterization of substituted orthorhombic and monoclinic tubular phases”. Domengès B, Caldes MT, Hervieu M, Van Tendeloo G, Raveau B, Icem 13, 963 (1994)
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HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys”. Schryvers D, Van Tendeloo G, van Landuyt J, Tanner LE, Icem 13, 659 (1994)
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HREM study of Rb6C60 and helical carbon nanotubules”. Bernaerts D, Zhang XB, Zhang XF, Van Tendeloo G, van Landuyt J, Amelinckx S, Icem 13, 305 (1994)
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Laser microprobe mass spectrometry in biology and biomedicine”. Eeckhaoudt S, van Vaeck L, Gijbels R, van Grieken RE, Scanning microscopy S8, 335 (1994)
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Martensitic and bainitic transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 C2, 225 (1994)
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Nonlinear Schrödinger equation on a ring”. Smondyrev MA, Vansant P, Peeters FM, Devreese JT, JINR communications (1994)
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Nucleation and growth of the Ni5Al3 in NiAl austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner LE, Journal de physique: 4 C2, 299 (1994)
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The “oblique&rdquo, zone imaging of the superlattice in complex crystal structure”. Milat O, Krekels T, Van Tendeloo G, Amelinckx S, Icem 13, 859 (1994)
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Physics of generation and detection of signals used for microcharacterization”. Remond G, Gijbels R, Levenson LL, Shimizu R Scanning Microscopy International, Chicago, Ill. (1994).
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Shallow-donor states in strongly-coupled super-lattices”. Shi JM, Peeters FM, Devreese JT, Bulletin of the American Physical Society 39, 488 (1994)
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Structural considerations on LanTin-\deltaO3n”. Weill F, Fompeyrine J, Darriet B, Darriet J, Bontchev R, Amelinckx S, Van Tendeloo G, Icem 13, 903 (1994)
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Optics for X-ray microfluorescence to be used at the European synchrotron radiation facility”. Vincze L, Janssens K, Adams F, Advances in X-ray analysis 37, 553 (1994)
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In situ infrared and electrical characterization of tin dioxide gas sensors in nitrogen/oxygen mixtures at temperatures up to 720 K”. Lenaerts S, Honoré, M, Huyberechts G, Roggen J, Maes G, Sensors and actuators : B : chemical 19, 478 (1994). http://doi.org/10.1016/0925-4005(93)01048-9
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Synthesis and characterization of tin dioxide powders for the realization of thick-film gas sensors”. Honoré, M, Lenaerts S, Desmet J, Huyberechts G, Roggen J, Sensors and actuators : B : chemical 19, 621 (1994). http://doi.org/10.1016/0925-4005(93)01224-R
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Analysis of individual aerosol particles in Siberian region: provisional results”. van Malderen H, Van Grieken R, Khodzher TV, Bufetov NS, Koutsenogii KP, Atmospheric and oceanic optics 7, 622 (1994)
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