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“An ab initio study of the C3+ cation using multireference methods”. Taylor PR, Martin JML, François JP, Gijbels R, The journal of chemical physics 95, 6530 (1991)
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“L'analyse des eaux géothermales par spectrométrie de masse à, étincelles”. Vandelannoote R, Blommaert W, van Grieken R, Gijbels R, Spectra 2000: la revue de l'instrumentation 53, 66 (1979)
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“Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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Gijbels R, van Grieken R (1977) Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees). S.l
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Gijbels R, van Grieken R, Blommaert W, Van 't dack L, van Espen P, Nullens H, Saelens R (1983) Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges). S.l
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“Application of neural networks in image analysis: the classification of geometrical shapes”. Geuens I, Nys B, Gijbels R, Jacob W, CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10, 61 (1993)
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“Application of trace element analysis to geothermal waters”. Gijbels R, van Grieken R, Blommaert W, Vandelannoote R, Van 't dack L, , 429 (1977)
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“Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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“Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 3, 1 (1994)
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“Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
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“Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals”. Gijbels R, Acta technica Belgica: metallurgie 30, 91 (1991)
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“The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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“Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
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“Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques”. Oleshko VP, Gijbels R, Jacob W, , 46 (1996)
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“Comportement hydrogéochimique des éléments traces au cours de l'interaction eau –, roche en milieu alcalin”. Pentcheva EN, Petrov PS, Veldeman E, Van 't dack L, Gijbels R, Doklady Bolgarskoi Akademii Nauk 43, 51 (1990)
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“Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds”. Pentcheva E, Van 't dack L, Veldeman E, Gijbels R, Comptes rendus de l'Académie bulgare des sciences 49, 61 (1996)
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“The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES”. Shimizu K, Habazaki H, Bender H, Gijbels R, Engineering materials 52, 97 (2004)
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“Depth profiling of coated steel wires by GDMS”. van Straaten M, Butaye L, Gijbels R, , 629 (1992)
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“Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 479 (1992)
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“Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, , 479 (1991)
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van Grieken R, Gijbels R, Speecke A, Hoste J (1971) Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis. S.l
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“Development of a Fourier transform laser microprobe mass spectrometer with external ion source”. Gijbels R, ICR/Ion trap newsletter 30 (1993)
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“Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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“Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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“Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
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“Equilibrium constants for trace elements in natural waters”. Van 't dack L, Blommaert W, Vandelannoote R, Gijbels R, van Grieken R, Reviews in analytical chemistry 7, 297 (1983)
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“Études génétiques du système “eau thermale –, gaz –, roche&rdquo, sous l'influence de phénomènes volcaniques récents”. Pentcheva EN, Petrov PS, Van 't dack L, Gijbels R, Doklady Bolgarskoi Akademii Nauk 48, 99 (1995)
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“Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis”. van Roy W, van Vaeck L, Gijbels R, , 1959 (1992)
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“Evolution of impurity clusters and mechanism of formation of photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV Antwerp, page 275 (1998).
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“Evolution of impurity clusters and photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV, Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45, 1 (2000)
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