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| Author | Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A.; | ||||
| Title | Characterization of {111} planar defects induced in silicon by hydrogen plasma treatments | Type | A1 Journal article | ||
| Year | 2006 | Publication | Philosophical magazine | Abbreviated Journal | Philos Mag |
| Volume | 86 | Issue | 32 | Pages | 5137-5151 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000239756300010 | Publication Date | 2006-07-27 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume  |
Series Issue | Edition | |||
| ISSN | 1478-6435;1478-6443; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.505 | Times cited | 12 | Open Access | |
| Notes | Bil 01/73 | Approved | Most recent IF: 1.505; 2006 IF: 1.354 | ||
| Call Number | UA @ lucian @ c:irua:60895 | Serial | 315 | ||
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