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| Author | Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. | ||||
| Title | Atomic scale characterization of supported and assembled nanoparticles | Type | P3 Proceeding | ||
| Year | 2001 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | B8.3,1-6 | ||
| Keywords | P3 Proceeding; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | s.l. | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue  |
Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:48390 | Serial | 181 | ||
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