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| Author | Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. | ||||
| Title | Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples | Type | P3 Proceeding | ||
| Year | 2014 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | |||
| Keywords | P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA) | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | S.l. | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
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Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:124548 | Serial | 2866 | ||
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