| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Callaert, C. | ||||
| Title | Characterization of defects, modulations and surface layers in topological insulators and structurally related compounds | Type | Doctoral thesis | ||
| Year | 2020 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 180 p. | ||
| Keywords | Doctoral thesis; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ admin @ c:irua:165867 | Serial  |
6288 | ||
| Permanent link to this record | |||||