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International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 27-29, 2023, Kobe, Japan |
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Research in microbiology |
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Composites: part A: applied science and manufacturing |
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Journal Of Physics-materials |
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Diamond and related materials
T2 – 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC |
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Chemicke zvesti |
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Few-body systems
T2 – International Workshop on Dynamics and Structure of Critically Stable, Quantum Few-Body Systems, OCT 08-12, 2001, LES HOUCHES, FRANCE |
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Progress in organic coatings |
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Journal of magnetism and magnetic materials
T2 – Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France |
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Journal of the American Academy of Dermatology |
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Journal of inorganic biochemistry |
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International journal for equity in health |
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Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
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Stain technology |
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International Journal Of Life Cycle Assessment |
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Journal Of Analytical Toxicology |
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Inorganic materials |
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International journal of applied ceramic technology |
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JPhys Energy |
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Calphad computer coupling of phase diagrams and thermochemistry |
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Optika atmospheri i okeana |
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Nature photonics |
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South African journal of chemistry = Suid-Afrikaanse tydskrif vir chemie |
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Sensors and actuators : B : chemical
T2 – 25th Eurosensors Conference, SEP 04-07, 2011, Athens, GREECE |
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Defects and diffusion in metals |
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Journal of Water Process Engineering |
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European Physical Journal B |
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ICOMAT |
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Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam, Processing – Fr |
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International journal of RF and microwave computer-aided engineering |
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