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Author |
Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
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Title |
Glow discharge optical spectroscopy and mass spectrometry |
Type |
H1 Book chapter |
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Year |
2009 |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1-28 |
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Keywords |
H1 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Abstract |
Optical (atomic absorption spectroscopy, AAS; atomic emission spectroscopy, AES; atomic fluorescence spectroscopy, AFS; and optogalvanic spectroscopy) and mass spectrometric (magnetic sector, quadrupolemass analyzer, QMA; quadrupole ion trap, QIT; Fourier transform ion cyclotron resonance, FTICR; and time-of-flight, TOF) instrumentation are well suited for coupling to the glow discharge (GD). The GD is a relatively simple device. A potential gradient (5001500 V) is applied between an anode and a cathode. In most cases, the sample is also the cathode. A noble gas (e.g. Ar, Ne, and Xe) is introduced into the discharge region before power initiation. When a potential is applied, electrons are accelerated toward the anode. As these electrons accelerate, they collide with gas atoms. A fraction of these collisions are of sufficient energy to remove an electron from a support gas atom, forming an ion. These ions are, in turn, accelerated toward the cathode. These ions impinge on the surface of the cathode, sputtering sample atoms from the surface. Sputtered atoms that do not redeposit on the surface diffuse into the excitation/ionization regions of the plasma where they can undergo excitation and/or ionization via a number of collisional processes. GD sources offer a number of distinct advantages that make them well suited for specific types of analyses. These sources afford direct analysis of solid samples, thus minimizing the sample preparation required for analysis. The nature of the plasma also provides mutually exclusive atomization and excitation processes that help to minimize the matrix effects that plague so many other elemental techniques. Unfortunately, the GD source functions optimally in a dry environment, making analysis of solutions more difficult. These sources also suffer from difficulties associated with analyzing nonconductingsamples. In this article, first, the principles of operation of the GD plasma are reviewed, with an emphasis on how those principles relate to optical spectroscopy and mass spectrometry. Basic applications of the GD techniques are considered next. These include bulk analysis, surface analysis, and the analysis of solution samples. The requirements necessary to obtain optical information are addressed following the analytical applications. This section focuses on the instrumentation needed to make optical measurements using the GD as an atomization/excitation source. Finally, mass spectrometric instrumentation and interfaces are addressed as they pertain to the use of a GD plasma as an ion source. GDsources provide analytically useful gas-phase species from solid samples. These sources can be interfaced with avariety of spectroscopic and spectrometric instruments for both quantitative and qualitative analysis. |
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Wiley |
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Chichester |
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0000-00-00 |
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0471976709 |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:78169 |
Serial |
1352 |
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Author |
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
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Title |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
Type |
P3 Proceeding |
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Year |
1998 |
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Volume |
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Pages |
871-874 |
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Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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Chichester |
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0000-00-00 |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:20471 |
Serial |
1555 |
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Author |
Vertes, A.; Gijbels, R.; Adams, F. |
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Title |
Introduction |
Type |
H3 Book chapter |
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Year |
1993 |
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Issue |
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Pages |
1-6 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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New York |
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0000-00-00 |
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no |
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Call Number |
UA @ lucian @ c:irua:6122 |
Serial |
1720 |
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Author |
Vertes, A.; Gijbels, R.; Adams, F. |
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Title |
Laser ionization mass analysis |
Type |
ME1 Book as editor or co-editor |
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Year |
1993 |
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ME1 Book as editor or co-editor; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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New York |
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Wos |
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0000-00-00 |
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ISBN |
0-471-53673-3 |
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INSTRUMENTS & INSTRUMENTATION 31/56 Q3 # NUCLEAR SCIENCE & TECHNOLOGY 9/32 Q2 # PHYSICS, PARTICLES & FIELDS 24/28 Q4 # SPECTROSCOPY 28/43 Q3 # |
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Call Number |
UA @ lucian @ c:irua:6121 |
Serial |
1789 |
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Author |
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
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Title |
Lasers in mass spectrometry: organic and inorganic instrumentation |
Type |
H3 Book chapter |
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Year |
1993 |
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Pages |
7-126 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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New York |
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0000-00-00 |
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no |
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Call Number |
UA @ lucian @ c:irua:6123 |
Serial |
1799 |
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Author |
Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
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Title |
Mass spectrometry, inorganic |
Type |
H3 Book chapter |
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Year |
1998 |
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Issue |
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Pages |
2650-2661 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wiley |
Place of Publication |
Chichester |
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0000-00-00 |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:20970 |
Serial |
1954 |
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Author |
Vertes, A.; Gijbels, R. |
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Title |
Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods |
Type |
H3 Book chapter |
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Year |
1993 |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
127-175 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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New York |
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0000-00-00 |
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no |
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Call Number |
UA @ lucian @ c:irua:7325 |
Serial |
2019 |
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Author |
de Witte, H.; Vandervorst, W.; Gijbels, R. |
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Title |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
Type |
P3 Proceeding |
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Year |
1998 |
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Abbreviated Journal |
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Issue |
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Pages |
327-330 |
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Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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Chichester |
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0000-00-00 |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:20470 |
Serial |
2120 |
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Author |
Bogaerts, A.; Gijbels, R. |
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Title |
Numerical modelling of analytical glow discharges |
Type |
H3 Book chapter |
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Year |
2003 |
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Pages |
155-205 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
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Chichester |
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0000-00-00 |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:40195 |
Serial |
2400 |
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Author |
Bogaerts, A.; Gijbels, R. |
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Title |
Plasma models |
Type |
H3 Book chapter |
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Year |
1997 |
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Abbreviated Journal |
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Pages |
176-191 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
Place of Publication |
New York |
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Wos |
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Publication Date |
0000-00-00 |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:19610 |
Serial |
2638 |
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Author |
Verlinden, G.; Gijbels, R.; Geuens, I. |
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Title |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
Type |
P3 Proceeding |
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Year |
1998 |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
995-998 |
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Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
Place of Publication |
Chichester |
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Wos |
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0000-00-00 |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:20472 |
Serial |
2761 |
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Author |
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
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Title |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
Type |
H3 Book chapter |
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Year |
1996 |
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Abbreviated Journal |
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Pages |
161-164 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3) |
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Wiley |
Place of Publication |
Chichester |
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Wos |
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0000-00-00 |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:27361 |
Serial |
2765 |
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Author |
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
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Title |
Structural characterization of organic molecules by laser mass spectrometry |
Type |
H3 Book chapter |
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Year |
1993 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
177-319 |
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Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
Place of Publication |
New York |
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Wos |
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0000-00-00 |
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Call Number |
UA @ lucian @ c:irua:6124 |
Serial |
3222 |
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Author |
Adams, F.; Gijbels, R.; Van Grieken, R. |
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Title |
Inorganic mass spectrometry |
Type |
ME3 Book as editor |
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Year |
1988 |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
404 p. |
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Keywords |
ME3 Book as editor; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wiley |
Place of Publication |
Chichester |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:117469 |
Serial |
4523 |
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Author |
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
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Title |
Structural characterization of SnS crystals formed by chemical vapour deposition |
Type |
A1 Journal article |
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Year |
2017 |
Publication |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
Abbreviated Journal |
J Microsc-Oxford |
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Volume |
268 |
Issue |
3 |
Pages |
276-287 |
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Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Abstract |
<script type='text/javascript'>document.write(unpmarked('The crystal and defect structure of SnS crystals grown using chemical vapour deposition for application in electronic devices are investigated. The structural analysis shows the presence of two distinct crystal morphologies, that is thin flakes with lateral sizes up to 50 m and nanometer scale thickness, and much thicker but smaller crystallites. Both show similar Raman response associated with SnS. The structural analysis with transmission electron microscopy shows that the flakes are single crystals of -SnS with [010] normal to the substrate. Parallel with the surface of the flakes, lamellae with varying thickness of a new SnS phase are observed. High-resolution transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), first-principles simulations (DFT) and nanobeam diffraction (NBD) techniques are employed to characterise this phase in detail. DFT results suggest that the phase is a strain stabilised \u0027 one grown epitaxially on the -SnS crystals. TEM analysis shows that the crystallites are also -SnS with generally the [010] direction orthogonal to the substrate. Contrary to the flakes the crystallites consist of two to four grains which are tilted up to 15 degrees relative to the substrate. The various grain boundary structures and twin relations are discussed. Under high-dose electron irradiation, the SnS structure is reduced and -Sn formed. It is shown that this damage only occurs for SnS in direct contact with SiO2. Lay description SnS is a p-type semiconductor, which has attracted significant interest for electronic devices due to its unique properties, low-toxicity and abundance of Sn in nature. Although in the past it has been most extensively studied as the absorber material in solar cells, it has recently garnered interest for application as a p-type two-dimensional semiconductor in nanoelectronic devices due to its anisotropic layered structure similar to the better known phosphorene. Tin sulphide can take the form of several phases and the electronic properties of the material depend strongly on its crystal structure. It is therefore crucial to study the crystal structure of the material in order to predict the electronic properties and gain insight into the growth mechanism. In this work, SnS crystals deposited using a chemical vapour deposition technique are investigated extensively for their crystal and defect structure using transmission electron microscopy (TEM) and related techniques. We find the presence of two distinct crystal morphologies, that is thin flakes with lateral sizes up to 50 m and nm scale thickness, and much thicker but smaller crystallites. The flakes are single crystals of -SnS and contain lamellae with varying thickness of a different phase which appear to be -SnS at first glance. High-resolution scanning transmission electron microscopy is used to characterise these lamellae where the annular bright field (ABF) mode better reveals the position of the sulphur columns. The sulphur columns in the lamellae are found to be shifted relative to the -SnS structure which indicates the formation of a new phase which is a distorted version of the phase which we tentatively refer to as \u0027-SnS. Simulations based on density functional theory (DFT) are used to model the interface and a similar shift of sulphur columns in the -SnS layer is observed which takes place as a result of strong interaction at the interface between the two phases resulting in strain transfer. Nanobeam electron diffraction (NBD) is used to map the lattice mismatch in the thickness of the flakes which reveals good in-plane matching and some expansion out-of-plane in the lamellae. Contrary to the flakes the crystallites are made solely of -SnS and consist of two to four grains which are tilted up to 15 degrees relative to the substrate. The various grain boundary structures and twin relations are discussed. At high electron doses, SnS is reduced to -Sn, however the damage occurs only for SnS in direct contact with SiO2.')); |
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Wiley |
Place of Publication |
Hoboken |
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000415900300009 |
Publication Date |
2017-09-28 |
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ISSN |
0022-2720 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.692 |
Times cited |
2 |
Open Access |
Not_Open_Access |
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Approved |
Most recent IF: 1.692 |
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Call Number |
UA @ lucian @ c:irua:147692 |
Serial |
4898 |
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Author |
Oleshko, V.; Gijbels, R. |
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Title |
Scanning microanalysis |
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H1 Book chapter |
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Year |
1997 |
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427-456 |
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H1 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley-VCH |
Place of Publication |
Weinheim |
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Publication Date |
0000-00-00 |
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UA library record |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:20474 |
Serial |
2945 |
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