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| Record | |||||
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| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. | ||||
| Title | Statistical experimental design for quantitative atomic resolution transmission electron microscopy | Type | H1 Book chapter | ||
| Year | 2004 | Publication | Abbreviated Journal | Adv Imag Elect Phys | |
| Volume | Issue | Pages | 1-164 | ||
| Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
Publisher  |
Academic Press | Place of Publication | San Diego, Calif. | Editor | |
| Language | Wos | 000223226700001 | Publication Date | 2011-01-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1076-5670; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 13 | Open Access | ||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:47513 | Serial | 3156 | ||
| Permanent link to this record | |||||