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The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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Introduction”. Vertes A, Gijbels R, Adams F Wiley, New York, page 1 (1993).
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Vertes A, Gijbels R, Adams F (1993) Laser ionization mass analysis. Wiley, New York
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Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, Gijbels R, Caravatti P San Francisco Press, San Francisco, Calif., page 595 (1993).
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Lasers in mass spectrometry: organic and inorganic instrumentation”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 7 (1993).
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Magneto-optics of shallow impurities in superlattices”. Peeters FM, Shi JM, Devreese JT Kluwer, Dordrecht, page 221 (1993).
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Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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Methods of structural analysis of modulated structures and quasicrystals”. van Landuyt J, Kuypers S, van Heurck C, Van Tendeloo G, Amelinckx S s.l., page 205 (1993).
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Methods using low and medium laser irradiance: laser-induced thermal desorption and matrix-assisted methods”. Vertes A, Gijbels R Wiley, New York, page 127 (1993).
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Polaron cyclotron resonance spectrum with interface optical phonon modes in GaAs/AlAs quantum wells”. Hai GQ, Peeters FM, Devreese JT Kluwer, Dordrecht, page 243 (1993).
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Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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Adams F, Gijbels R, Van Grieken R, Dachang Z (1993) Inorganic mass spectrometry. Fudan University Press, Shanghai, 391 p
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Environmental aerosol characterization by single particle analysis techniques”. Xhoffer C, Van Grieken R page 207 (1993).
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North Sea aerosol characterization by single particle analysis techniques”. van Malderen H, de Bock L, Injuk J, Xhoffer C, Van Grieken R page 119 (1993).
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Source apportionment of individual aerosol particles at Hungarian background stations”. Török S, Szandor S, Xhoffer C, Van Grieken R page 32 (1993).
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Study of the heavy metal concentration, deposition and sources of the North Sea aerosols using X-ray emission techniques”. Injuk J, van Malderen H, Van Grieken R page 793 (1993).
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Graphene textures: tubules and whiskers related to fullerene crystallography”. Van Tendeloo G, Amelinckx S, van Landuyt J, Acta crystallographica: section A: foundations of crystallography 49, 355 (1993)
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Structural effects of element substitution in the CuO plane of the 1-2-3 YBCO superconductor”. Krekels T, Van Tendeloo G, Amelinckx S, van Landuyt J, Acta crystallographica: section A: foundations of crystallography 49, 287 (1993)
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Superlattice variants in Sr2CuO2(CO3): an electron microscopy study”. Milat O, Van Tendeloo G, van Landuyt J, Amelinckx S, Acta crystallographica: section A: foundations of crystallography 49, 357 (1993)
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HREM and ED study of the displacive transformation of the Ni2Al phase in a Ni65Al35 alloy and associated with the martensitic transformation”. Muto S, Schryvers D, Merk N, Tanner LE, Acta metallurgica et materialia 41, 2377 (1993)
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Structural studies on superconducting materials and fullerites by electron microscopy”. Van Tendeloo G, Amelinckx S, Advanced materials 5, 620 (1993). http://doi.org/10.1002/adma.19930050904
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Laser ionization mass spectrometry for the characterization of solid materials”. van Vaeck L, van Roy W, Gijbels R, Analusis : chimie analytique, méthodes physiques d'analyse, composition de la matière 21, 53 (1993)
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Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis”. Struyf H, van Roy W, van Vaeck L, van Grieken R, Gijbels R, Caravatti P, Analytica chimica acta 283, 139 (1993). http://doi.org/10.1016/0003-2670(93)85216-7
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Surface microanalysis”. Adams F, Adriaens A, Berghmans P, Janssens K, Analytica chimica acta 283, 19 (1993). http://doi.org/10.1016/0003-2670(93)85207-Z
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Studying aerosol samples by non-linear mapping of electron probe microanalysis data”. Treiger B, van Malderen H, Bondarenko I, van Espen P, Van Grieken R, Analytica chimica acta 284, 119 (1993). http://doi.org/10.1016/0003-2670(93)80014-C
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Hydrodynamic model of matrix-assisted laser desorption mass spectrometry”. Vertes A, Irinyi G, Gijbels R, Analytical chemistry 65, 2389 (1993). http://doi.org/10.1021/ac00065a036
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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