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| Author | Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Ju, H.L.; Krishnan, K.M. | ||||
| Title | High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films | Type | A1 Journal article | ||
| Year | 2000 | Publication | Philosophical magazine: A: physics of condensed matter: defects and mechanical properties | Abbreviated Journal | Philos Mag A |
| Volume | 80 | Issue | 3 | Pages | 673-691 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000085873500011 | Publication Date  |
2007-07-08 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0141-8610;1460-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 52 | Open Access | ||
| Notes | IUAP 4-10; reprint | Approved | Most recent IF: NA | ||
| Call Number | UA @ lucian @ c:irua:54751 | Serial | 1456 | ||
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