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Author |
Skorikov, A.; Heyvaert, W.; Albrecht, W.; Pelt, D.M.; Bals, S. |
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Title |
EMAT Simulated 3D Nanoparticle Structures Dataset |
Type |
Dataset |
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Year |
2021 |
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Dataset; Electron microscopy for materials research (EMAT) |
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Abstract |
This dataset contains 1000 simulated nanoparticle-like 3D structures and noisy EDX-like elemental maps based on them. These data are intended to be used for quantitative analysis of data processing methods in (EDX) tomography of nanoparticles and training the data-driven approaches for these tasks. The dataset is structured as follows: voxel_data/clean 3D voxel grid representation of the simulated nanoparticles. Voxel intensities are adjusted so that the total intensity equals 103. All 3D structures have unique identifiers in 0..999 range. The data derived from a 3D structure preserves this unique identifier. sinograms/clean Tilt series of projection images obtained from the corresponding 3D structures over an angular range of -75..75 degrees with a tilt step of 10 degrees to simulate a typical tilt series used in EDX tomography. Total intensity in each projection image equals 103. sinograms/noisy Tilt series of projection images corrupted with Poisson noise and an additional spatially uniform background noise. projections/clean Projection images extracted from the clean tilt series at 0 degrees tilt angle. projections/noisy Projection images extracted from the noisy tilt series at 0 degrees tilt angle. images/clean Visualizations of the clean projections as PNG images with the intensity range adjusted to 0..255 images/noisy Visualizations of the noisy projections as PNG images with the intensity range adjusted to 0..255 |
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Most recent IF: NA |
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Call Number |
UA @ admin @ c:irua:180615 |
Serial |
6838 |
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Author |
Grünewald, L.; Chezganov, D.; De Meyer, R.; Orekhov, A.; Van Aert, S.; Bogaerts, A.; Bals, S.; Verbeeck, J. |
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Title |
Supplementary Information for “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope” |
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Year |
2023 |
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Dataset; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Abstract |
Supplementary information for the article “In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope” containing the videos of in-situ SEM imaging (mp4 files), raw data/images, and Jupyter notebooks (ipynb files) for data treatment and plots. Link to the preprint: https://doi.org/10.48550/arXiv.2308.15123 Explanation of the data files can be found in the Information.pdf file. The Videos folder contains the in-situ SEM image series mentioned in the paper. If there are any questions/bugs, feel free to contact me at lukas.grunewaldatuantwerpen.be |
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no |
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Call Number |
UA @ admin @ c:irua:203389 |
Serial |
9100 |
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Author |
Liz-Marzan, L.; Bals, S. |
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Title |
Advanced particle characterization techniques |
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Editorial |
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Year |
2016 |
Publication |
Particle and particle systems characterization |
Abbreviated Journal |
Part Part Syst Char |
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Volume |
33 |
Issue |
33 |
Pages |
350-351 |
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Keywords |
Editorial; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Wiley-v c h verlag gmbh |
Place of Publication |
Weinheim |
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Wos |
000379970000001 |
Publication Date |
2016-07-14 |
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0934-0866 |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
4.474 |
Times cited |
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Not_Open_Access |
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; ; |
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Most recent IF: 4.474 |
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Call Number |
UA @ lucian @ c:irua:134957 |
Serial |
4136 |
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Author |
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
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Title |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
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H1 Book chapter |
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Year |
2008 |
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Abbreviated Journal |
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Pages |
273-274 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Springer |
Place of Publication |
Berlin |
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0000-00-00 |
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ISBN |
978-3-540-85226-1 |
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UA library record |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:87610 |
Serial |
1055 |
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Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
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Title |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
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H1 Book chapter |
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2008 |
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97-98 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Springer |
Place of Publication |
Berlin |
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Wos |
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Publication Date |
2009-03-17 |
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ISBN |
978-3-540-85154-7 |
Additional Links |
UA library record |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:136865 |
Serial |
4493 |
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Author |
Bals, S.; Stes, A.; Celis, V. |
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Title |
Klassieke toetsing in de praktijk |
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H2 Book chapter |
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2009 |
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211-225 |
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Keywords |
H2 Book chapter; Educational sciences; EduBROn; Electron microscopy for materials research (EMAT) |
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LannooCampus |
Place of Publication |
Leuven |
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0000-00-00 |
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ISBN |
978 90 209 8819 2 |
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UA library record |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:79658 |
Serial |
1762 |
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Author |
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
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Title |
DART explained: how to carry out a discrete tomography reconstruction |
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P1 Proceeding |
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Year |
2008 |
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295-296 |
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Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab |
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Springer |
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Berlin |
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0000-00-00 |
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978-3-540-85154-7 |
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Additional Links |
UA library record |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:77914 |
Serial |
606 |
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Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. |
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Title |
Investigating lattice strain in Au nanodecahedrons |
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P1 Proceeding |
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2016 |
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11-12 |
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P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab |
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Publication Date |
2016-12-21 |
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978-3-527-80846-5 |
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Additional Links |
UA library record |
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Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:145813 |
Serial |
5144 |
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Author |
Kalesaki, E.; Boneschanscher, M.P.; Geuchies, J.J.; Delerue, C.; Morais Smith, C.; Evers, W.H.; Allan, G.; Altantzis, T.; Bals, S.; Vanmaekelbergh, D. |
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Title |
Preparation and study of 2-D semiconductors with Dirac type bands due to the honeycomb nanogeometry |
Type |
P1 Proceeding |
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Year |
2014 |
Publication |
Proceedings of the Society of Photo-optical Instrumentation Engineers
T2 – Proceedings of SPIE |
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Volume |
8981 |
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Pages |
898107-898107 |
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Keywords |
P1 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Abstract |
The interest in 2-dimensional systems with a honeycomb lattice and related Dirac-type electronic bands has exceeded the prototype graphene1. Currently, 2-dimensional atomic2,3 and nanoscale4-8 systems are extensively investigated in the search for materials with novel electronic properties that can be tailored by geometry. The immediate question that arises is how to fabricate 2-D semiconductors that have a honeycomb nanogeometry, and as a consequence of that, display a Dirac-type band structure? Here, we show that atomically coherent honeycomb superlattices of rocksalt (PbSe, PbTe) and zincblende (CdSe, CdTe) semiconductors can be obtained by nanocrystal self-assembly and facet-to-facet atomic bonding, and subsequent cation exchange. We present a extended structural analysis of atomically coherent 2-D honeycomb structures that were recently obtained with self-assembly and facet-to-facet bonding9. We show that this process may in principle lead to three different types of honeycomb structures, one with a graphene type-, and two others with a silicene-type structure. Using TEM, electron diffraction, STM and GISAXS it is convincingly shown that the structures are from the silicene-type. In the second part of this work, we describe the electronic structure of graphene-type and silicene type honeycomb semiconductors. We present the results of advanced electronic structure calculations using the sp3d5s* atomistic tight-binding method10. For simplicity, we focus on semiconductors with a simple and single conduction band for the native bulk semiconductor. When the 3-D geometry is changed into 2-D honeycomb, a conduction band structure transformation to two types of Dirac cones, one for S- and one for P-orbitals, is observed. The width of the bands depends on the honeycomb period and the coupling between the nanocrystals. Furthermore, there is a dispersionless P-orbital band, which also forms a landmark of the honeycomb structure. The effects of considerable intrinsic spin-orbit coupling are briefly considered. For heavy-element compounds such as CdTe, strong intrinsic spin-‐orbit coupling opens a non-trivial gap at the P-orbital Dirac point, leading to a quantum Spin Hall effect10-12. Our work shows that well known semiconductor crystals, known for centuries, can lead to systems with entirely new electronic properties, by the simple action of nanogeometry. It can be foreseen that such structures will play a key role in future opto-electronic applications, provided that they can be fabricated in a straightforward way. |
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000336040600004 |
Publication Date |
2014-03-07 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Times cited |
2 |
Open Access |
OpenAccess |
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Notes |
This work has been supported by funding of the French National Research Agency [ANR, (ANR-‐09-‐BLAN-‐0421-‐01)], NWO and the Dutch organization FOM [Programs “Control over Functional Nanoparticle Solids” (FNPS) and “Designing Dirac Carriers in Semiconductors” |
Approved |
Most recent IF: NA |
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Call Number |
c:irua:131912 |
Serial |
4039 |
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Author |
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
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Title |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
Type |
P3 Proceeding |
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Year |
2014 |
Publication |
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Abbreviated Journal |
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Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA) |
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Place of Publication |
S.l. |
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Wos |
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Publication Date |
0000-00-00 |
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Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:124548 |
Serial |
2866 |
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