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Records |
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Author |
Van Tendeloo, G.; De Meulenaere, P.; Hervieu, M.; Letouze, F.; Martin, C. |
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Title |
Cation ordering in Tl- and Hg-based superconducting materials |
Type |
P3 Proceeding |
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Year |
1996 |
Publication |
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Abbreviated Journal |
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Keywords |
P3 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Publication Date |
0000-00-00 |
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UA library record |
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Approved |
MATERIALS SCIENCE, MULTIDISCIPLINARY 96/271 Q2 # |
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Call Number |
UA @ lucian @ c:irua:110169 |
Serial |
298 |
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Permanent link to this record |
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Author |
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. |
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Title |
How to interpret short-range order HREM images |
Type |
P3 Proceeding |
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Year |
1996 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Dublin |
Editor |
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Wos |
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Publication Date |
0000-00-00 |
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Additional Links |
UA library record |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:110168 |
Serial |
1493 |
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Permanent link to this record |
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Author |
Tavernier, S.; op de Beeck, W.; Ghekiere, J.-P.; Van Tendeloo, G. |
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Title |
Positively charged toner for use in electrostatography : US5532097 : 07/02/1996 |
Type |
Patent |
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Year |
1996 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
Patent; Electron microscopy for materials research (EMAT) |
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Wos |
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Publication Date |
0000-00-00 |
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Series Volume |
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Series Issue |
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Edition |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:110388 |
Serial |
2680 |
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Permanent link to this record |