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Author Delville, R.; Kasinathan, S.; Zhang, Z.; van Humbeeck, J.; James, R.D.; Schryvers, D.
Title Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys Type A1 Journal article
Year 2010 Publication Philosophical magazine Abbreviated Journal Philos Mag
Volume 90 Issue 1/4 Pages 177-195
Keywords (up) A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Abstract Recent findings have linked low hysteresis in shape memory alloys with phase compatibility between austenite and martensite. To investigate the evolution of microstructure as phase compatibility increases and hysteresis is reduced, transmission electron microscopy was used to study the alloy system Ti50Ni50xPdx, where the composition is systemically tuned to approach perfect compatibility. Changes in morphology, twinning density and twinning modes are reported, along with special microstructures occurring when compatibility is achieved. In addition, the interface between austenite and a single variant of martensite was studied by high-resolution and conventional electron microscopy. The low energy configuration of the interface detailed in this article suggests that it plays an important role in the lowering of hysteresis compared to classical habit plane interfaces.
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Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000274576500013 Publication Date 2010-01-16
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1478-6435;1478-6443; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.505 Times cited 70 Open Access
Notes Multimat; FWO Approved Most recent IF: 1.505; 2010 IF: 1.304
Call Number UA @ lucian @ c:irua:79859 Serial 3718
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