| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
Links |
|
|
Schalm, O.; Janssens, K.; Caen, J.; Adams, F. |
Chemische en morfologische karakterisatie van de grissailles van Capronnier met behulp van EPXMA |
1999 |
|
|
|
UA library record |
|
|
|
Tsuji, K.; Nullens, R.; Wagatsuma, K.; Van Grieken, R.E. |
Elemental x-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA) |
1999 |
Journal of analytical atomic spectrometry |
14 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Ro, C.-U.; Oh, K.-Y.; Kim, H.K.; Chun, Y.; Van Grieken, R. |
Characterization of Asian dust using ultrathin window EPMA |
1999 |
|
|
|
UA library record |
|
|
|
Tafuri, F.; Granozio, F.M.; Carillo, F.; Lombardi, F.; Di Uccio, U.S.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. |
Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes |
1999 |
Physica: C : superconductivity |
327 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lemmens, H.; Richard, O.; Van Tendeloo, G.; Bismayer, U. |
Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3 |
1999 |
Journal of electron microscopy |
48 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers |
1999 |
Microelectronic engineering |
45 |
|
UA library record; WoS full record |
|
|
|
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM |
1999 |
Physica status solidi: A: applied research
T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland |
171 |
40 |
UA library record; WoS full record; WoS citing articles |
|
