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“High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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“Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
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“A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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“Mathematical modelling of an analytical glow discharge”. Bogaerts A, van Straaten M, Gijbels R KD Marketing Services, Milton Keynes, page 82 (1995).
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“Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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“Large bipolarons and high-Tc materials”. Devreese JT, Verbist G, Peeters FM Cambridge University Press, Cambridge, page 385 (1995).
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“Geothermal water analysis by X-ray fluorescence and neutron activation”. van Grieken R, Gijbels R, Blommaert W, Vandelannoote R, Van 't dack L US Energy Research and Development Administration, S.l., page 368 (1978).
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“Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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“Crystal chemistry of mercury based layered cuprates and oxycarbonates”. Raveau B, Hervieu M, Michel C, Martin C, Maignan A, Van Tendeloo G Narosa, New Delhi, page 132 (1995).
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“Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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“Orientation fluctuations, diffuse scattering and orientational order in solid C60”. Michel KH, Copley JRD World Scientific, Singapore, page 381 (1996).
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“The phase diagram”. Peeters FM Kluwer Academic Publishers, Dordrecht, page 17 (1997).
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“Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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“Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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“Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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“Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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“Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM”. Oleshko V, Schryvers D, Gijbels R, Jacob W s.l., page 293 (1998).
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“Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides”. Oleshko V, Gijbels R, Jacob W Spie, Washington, D.C., page 326 (1998).
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“Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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“Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
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“Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Microscopy of gemmological materials”. van Landuyt J, van Bockstael MHG, van Royen J Vch, Weinheim, page 293 (1997).
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“Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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“Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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“Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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“Evolution of impurity clusters and mechanism of formation of photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV Antwerp, page 275 (1998).
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“Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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