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High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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Electron microscopy of fullerenes and fullerene related structures”. Van Tendeloo G, van Landuyt J, Amelinckx S, , 498 (1994)
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Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
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Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
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Zhao H (2012) Vortex matter in superconductors with competing interactions : formation of vortex patterns and vortex dynamics. Antwerpen
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Barbier M (2012) Transport properties of nanostructures and superlattices on single-layer and bilayer graphene. Antwerpen
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A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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Lin N (2012) Dynamics of interacting clusters in low-dimensional superconductors. Antwerpen
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Mathematical modelling of an analytical glow discharge”. Bogaerts A, van Straaten M, Gijbels R KD Marketing Services, Milton Keynes, page 82 (1995).
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Physics of generation and detection of signals used for microcharacterization”. Remond G, Gijbels R, Levenson LL, Shimizu R Scanning Microscopy International, Chicago, Ill. (1994).
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A self-consistent mathematical model of a hollow cathode glow discharge”. Baguer N, Bogaerts A, Gijbels R, , 157 (1999)
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Determination of the silver sulphide cluster size distribution via computer simulations”. Charlier E, Gijbels R, Van Doorselaer M, De Keyzer R page 85 (2000).
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Simulation of plasma processes in plasma assisted CVD reactors”. Herrebout D, Bogaerts A, Goedheer W, Dekempeneer E, Gijbels R, , 213 (1999)
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Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization”. Idrissi H, Schryvers D Formatex Research Center, S.l., page 1213 (2012).
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Kishore VVR (2013) Electronic structure of core-shell nanowires. Antwerpen
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Polarity-dependent vortex pinning and spontaneous vortex-antivortex structures in superconductor/ferromagnet hybrids”. Bending SJ, Milošević MV, Moshchalkov VV Springer, Berlin, page 299 (2010).
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Khalilov U (2013) New perspectives on thermal and hyperthermal oxidation of Si surfaces. Antwerpen
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Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis”. Oleshko VP, Gijbels R, Amelinckx S Wiley, Chichester, page 1 (2013).
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Nanoparticles in glass and glazes”. Frederickx P, De Vis K, Wouters H, Helary D, Schryvers D, (2005)
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Modeling aspects of plasma-enhanced chemical vapor deposition of carbon-based materials”. Neyts E, Mao M, Eckert M, Bogaerts A CRC Press, Boca Raton, Fla, page 245 (2012).
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Zarenia M (2013) Confined states in mono- and bi-layer grapheme nanostructures. Antwerpen
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Batuk M (2013) New perovskite-based homologous series : AnBnO3n-2 and An+1BnO3n-1Cl. Antwerpen
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Carrillo Nuñ,ez H (2012) Combining the modified local density approach with variational calculus : a flexible tandem for studying electron transport in nano-devices. Antwerpen
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65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang”. Lichte H, Dunin-Borkowski R, Tillmann K, Van Aert S, Van Tendeloo G Amsterdam (2013).
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How to interpret short-range order HREM images”. De Meulenaere P, Van Tendeloo G, van Landuyt J, (1996)
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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Tavernier S, op de Beeck W, Ghekiere J-P, Van Tendeloo G (1996) Positively charged toner for use in electrostatography : US5532097 : 07/02/1996
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HREM study of short-range order in Cu-Pd alloys”. Rodewald M, Rodewald K, De Meulenaere P, Van Tendeloo G, (1996)
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Lu Y (2013) Electron energy-loss spectroscopy (EELS) characterization of diamond and related materials. Antwerpen
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