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| Author | Ro, C.-U.; Hoornaert, S.; Van Grieken, R. | ||||
| Title | Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis | Type | H3 Book chapter | ||
| Year | 2002 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 17-28 T2 - Reference materials for microanalytical | ||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
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| ISSN | ISBN | Additional Links  |
UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:39522 | Serial | 7505 | ||
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