| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Markowicz, A.A.; Van Grieken, R.E. | ||||
| Title | Quantification in XRF analysis of intermediate-thickness samples | Type | H3 Book chapter | ||
| Year | 2002 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 407-431 T2 - Handbook of X-ray spectrometry / Grie | ||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
Corporate Author  |
Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:36389 | Serial | 8433 | ||
| Permanent link to this record | |||||