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  Author (down) Title Year Publication Volume Times cited Additional Links Links
Worobiec, A.; Stefaniak, E.A.; Kiro, S.; Oprya, M.; Bekshaev, A.; Spolnik, Z.; Potgieter-Vermaak, S.S.; Ennan, A.; Van Grieken, R. Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods 2007 X-ray spectrometry 36 UA library record; WoS full record; WoS citing articles doi
Worobiec, A.; Kaplinski, A.; Van Grieken, R. Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles 2005 X-ray spectrometry 34 UA library record; WoS full record; WoS citing articles doi
Vekemans, B.; Janssens, K.; Vincze, L.; Aerts, A.; Adams, F.; Hertogen, J. Automated segmentation of μ-XRF image sets 1997 X-ray spectrometry 26 UA library record; WoS full record; WoS citing articles
Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. Analysis of X-ray spectra by iterative least squares (AXIL): new developments 1994 X-ray spectrometry 23 UA library record; WoS full record; WoS citing articles doi
Vanmeert, F.; Mudronja, D.; Fazinic, S.; Janssens, K.; Tibljas, D. Semi-quantitative analysis of the formation of a calcium oxalate protective layer for monumental limestone using combined micro-XRF and micro-XRPD 2013 X-ray spectrometry 42 5 UA library record; WoS full record; WoS citing articles pdf doi
van Malderen, H.; Hoornaert, S.; Injuk, J.; Przybylowicz, W.J.; Pineda, C.A.; Prozesky, V.M.; Van Grieken, R. Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.E.; Adams, F.C. Folding of aerosol loaded filters during X-ray fluorescence analysis 1976 X-ray spectrometry 5 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R.; Markowicz, A.; Veny, P. Current trends in the literature on X-ray emission spectrometry 1991 X-ray spectrometry 20 UA library record; WoS full record; WoS citing articles doi
Van Grieken, R. 2014 Award for best referee of X-Ray Spectrometry 2014 X-ray spectrometry 43 UA library record; WoS full record doi
Van Grieken, R. Awards for best referees of X-ray Spectrometry 2014 X-ray spectrometry 43 UA library record doi
Van Grieken, R. Editorial : award for best X-Ray Spectrometry referee during 2011-2012 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. Editorial: Award for best XRS referee during 2007-2008 2008 X-ray spectrometry 37 UA library record; WoS full record doi
Van Grieken, R. Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Grieken, R. Introducing four new members of the editorial board of X-ray spectrometry 2015 X-ray spectrometry 44 UA library record; WoS full record doi
Van Grieken, R. Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry 2014 X-ray spectrometry 43 UA library record; WoS full record doi
Van Grieken, R. New Chinese members of the Advisory Board of X-Ray Spectrometry 2006 X-ray spectrometry 35 UA library record
Van Grieken, R. New members of the editorial board of X-ray Spectrometry 2013 X-ray spectrometry 42 UA library record; WoS full record pdf doi
Van Dyck, P.; Van Grieken, R. Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution 1983 X-ray spectrometry 12 UA library record; WoS full record doi
Van Dyck, P.; Török, S.; Van Grieken, R. Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles doi
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Influence of sample thickness, excitation energy and geometry on particle size effects in XRF 1985 X-ray spectrometry 14 UA library record; WoS full record; WoS citing articles doi
van der Snickt, G.; Janssens, K.; Schalm, O.; Aibéo, C.; Kloust, H.; Alfeld, M. James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry 2010 X-ray spectrometry 39 25 UA library record; WoS full record; WoS citing articles doi
van der Linden, V.; Schalm, O.; Houbraken, J.; Thomas, M.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Janssens, K. Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries 2010 X-ray spectrometry 39 8 UA library record; WoS full record; WoS citing articles doi
Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range 1993 X-ray spectrometry 22 UA library record; WoS full record; WoS citing articles doi
Török, S.; Van Dyck, P.; Van Grieken, R. Heterogeneity effects in direct X-ray fluorescence analysis of hair 1984 X-ray spectrometry 13 UA library record; WoS full record; WoS citing articles doi
Török, S.; Braun, T.; Van Dyck, P.; Van Grieken, R. Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents 1986 X-ray spectrometry 15 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Szegedi, S.; Varga, K.; Braun, M.; Osán, J.; Van Grieken, R. Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Osán, J.; Worobiec, A.; de Hoog, J.; Van Grieken, R. Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles 2001 X-ray spectrometry 30 UA library record; WoS full record; WoS citing articles doi
Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles 1989 X-ray spectrometry 18 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.; Tsuji, K.; Van Grieken, R. Grazing-exit electron probe x-ray microanalysis of light elements in particles 2004 X-ray spectrometry 33 UA library record; WoS full record; WoS citing articles doi
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