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Author |
Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. |
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Title |
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications |
Type |
A1 Journal article |
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Year  |
1997 |
Publication |
Superconductor science and technology |
Abbreviated Journal |
Supercond Sci Tech |
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Volume |
10 |
Issue |
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Pages |
356-365 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Bristol |
Editor |
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Language |
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Wos |
A1997WY69100015 |
Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0953-2048 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.878 |
Times cited |
2 |
Open Access |
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Notes |
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Approved |
Most recent IF: 2.878; 1997 IF: 2.183 |
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Call Number |
UA @ lucian @ c:irua:21434 |
Serial |
2076 |
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| Permanent link to this record |
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Author |
Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. |
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Title |
Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers |
Type |
A1 Journal article |
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Year |
1995 |
Publication |
Physica: C : superconductivity |
Abbreviated Journal |
Physica C |
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Volume |
244 |
Issue |
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Pages |
373-388 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
A1995QQ29300025 |
Publication Date |
2003-04-05 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0921-4534; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
0.942 |
Times cited |
28 |
Open Access |
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Notes |
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Approved |
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Call Number |
UA @ lucian @ c:irua:13312 |
Serial |
3203 |
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Author |
Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. |
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Title |
Structural aspects of the combination of Si and YBa2Cu3O7-x |
Type |
A1 Journal article |
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Year |
1995 |
Publication |
Institute of physics conference series |
Abbreviated Journal |
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Volume |
146 |
Issue |
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Pages |
333-336 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The microstructure of defects and interfaces as well as interfacial reactions of the YBa2Cu3O7-x (YBCO) thin films on Si or Si on sapphire with single Y-stabilized ZrO2 (YSZ), double CeO2/YSZ or triple MgO/CeO2/YSZ buffer layer has been characterized by transmission electron microscopy The complex buffer made it possible to prevent detrimental interdiffusion and to control the orientation of YBCO layers. |
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Corporate Author |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
A1995BE73Q00070 |
Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0951-3248 |
ISBN |
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Additional Links |
UA library record; WoS full record; |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
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Call Number |
UA @ lucian @ c:irua:95922 |
Serial |
3211 |
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| Permanent link to this record |
